Subsurface Contamination Monitoring Using Laser Fluorescence (PDF)

While innovative technology in remediation needs to be developed, so do innovative ways of site assessment. This monograph describes the development, testing, and performance of a new laser-induced fluorescence soil probe. A screening tool for site characterization, this probe has the potential to provide an economical, rapid assessment of contaminated sites. Cone penetrometer testing equipment advances the probe into the subsurface. The probe identifies hydrocarbon classes using a multi-channel escitation-emmision matrix. This technique facilitates the collection of significant amounts of subsurface information, surpassing conventional data collection methods, that can be used to rapidly identify areas of concern beneath a site. The technology has significant application for the following: Rapid environmental site assessment; Monitoring remediation programs; Monitoring manufacturing processes and industrial waste water operations. Subsurface Contamination Monitoring using Laser Fluorescence provides comprehensive reference material for researchers and engineers as well as engineering consultants interested in subsurface monitoring techniques or further development of this technology. It describes innovative technology that focuses on finding cost effective solutions for site assessment and remediation. TOC:Introduction: LIF-CPT technology for Site Monitoring.- Project Background and Phases.- LIF-EEM Engineering Design: The Excitation-Emission Matrix.- Design Goals.- Selection of Excitation Wavelengths.- System Components.- Laser Energy Calibration at the Probe.- EEM Data Analysis.- Cone Penetrator Testing Equipment.- Summary of Technology Demonstration: General Scope of Data Analysis.- Hanscom AFB for Otis Field Operation.- Outlook: Development Goals.- Post-AATDF Development.- Field Testing.- Applicability of the LIF-EEM Technology: Detectable Contaminants.- Use of Data for Human Health Risk Assessments.- Limitations.- Equipment Development and Patent Considerations.- Comparison with other LIF Systems: The SCAPS System.- The Furgo Geosciences ROST system.- The Tufts University System.- Typical Costs.- References. Appendices.