Spectroscopic Ellipsometry for Photovoltaics / Springer Series in Optical Sciences Bd.212 (PDF)
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This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.
The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.
- 2019, 1st ed. 2018, 594 Seiten, Englisch
- Herausgegeben: Hiroyuki Fujiwara, Robert W. Collins
- Verlag: Springer-Verlag GmbH
- ISBN-10: 3319753770
- ISBN-13: 9783319753775
- Erscheinungsdatum: 10.01.2019
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- Dateiformat: PDF
- Grösse: 23 MB
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