Electronic Properties of Semiconductor Interfaces / Springer Series in Surface Sciences Bd.43 (PDF)
Almost all semiconductor devices contain metal-semiconductor, insulator-semiconductor, insulator-metal and/or semiconductor-semiconductor interfaces; and their electronic properties determine the device characteristics. This is the first monograph that...
- Kreditkarte, Paypal, Rechnung
- Kostenloser tolino webreader
Almost all semiconductor devices contain metal-semiconductor, insulator-semiconductor, insulator-metal and/or semiconductor-semiconductor interfaces; and their electronic properties determine the device characteristics. This is the first monograph that treats the electronic properties of all different types of semiconductor interfaces. Using the continuum of interface-induced gap states (IFIGS) as the unifying concept, Mönch explains the band-structure lineup at all types of semiconductor interfaces. These intrinsic IFIGS are the wave-function tails of electron states, which overlap a semiconductor band-gap exactly at the interface, so they originate from the quantum-mechanical tunnel effect. He shows that a more chemical view relates the IFIGS to the partial ionic character of the covalent interface-bonds and that the charge transfer across the interface may be modeled by generalizing Pauling's electronegativity concept. The IFIGS-and-electronegativity theory is used to quantitatively explain the barrier heights and band offsets of well-characterized Schottky contacts and semiconductor heterostructures, respectively.
- Autor: Winfried Mönch
- 2013, 2004, 264 Seiten, Englisch
- Verlag: Springer Berlin Heidelberg
- ISBN-10: 3662069458
- ISBN-13: 9783662069455
- Erscheinungsdatum: 17.04.2013
Abhängig von Bildschirmgrösse und eingestellter Schriftgrösse kann die Seitenzahl auf Ihrem Lesegerät variieren.
- Dateiformat: PDF
- Grösse: 21 MB
- Ohne Kopierschutz
- Vorlesefunktion
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Electronic Properties of Semiconductor Interfaces / Springer Series in Surface Sciences Bd.43".
Kommentar verfassen