Solder Joint Reliability Prediction for Multiple Environments
(Sprache: Englisch)
Here is a text that will provide industry engineers, graduate students, academic researchers, and reliability experts with insights and useful tools for evaluating solder joint reliability of ceramic area array electronic packages under multiple environments.
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Produktinformationen zu „Solder Joint Reliability Prediction for Multiple Environments “
Here is a text that will provide industry engineers, graduate students, academic researchers, and reliability experts with insights and useful tools for evaluating solder joint reliability of ceramic area array electronic packages under multiple environments.
Klappentext zu „Solder Joint Reliability Prediction for Multiple Environments “
Solder Joint Reliability Prediction for Multiple Environments will provide industry engineers, graduate students and academic researchers, and reliability experts with insights and useful tools for evaluating solder joint reliability of ceramic area array electronic packages under multiple environments. The material presented here is not limited to ceramic area array packages only, it can also be used as a methodology for relating numerical simulations and experimental data into an easy-to-use equation that captures the essential information needed to predict solder joint reliability. Such a methodology is often needed to relate complex information in a simple manner to managers and non-experts in solder joint who work with computer server applications as well as for harsh environments such as those found in the defense, space, and automotive industries.
Inhaltsverzeichnis zu „Solder Joint Reliability Prediction for Multiple Environments “
Background.- Literature Review.- Unified Finite Element Modeling for Prediction of Solder Joint Fatigue.- Validation of Unified FEM for Thermal Cycling and Power.- Development of Fatigue Life Equations Under Low-Cycle Thermal and Power Cycling.- Validation of Unified FEM and Development of Fatigue-life Equations for Vibration.- Universal Predictive Fatigue Life Equation and the Effect of Design Parameters.- Acceleration Factor to Relate Thermal Cycles to Power Cycles for CBGA Packages.- Solder Joint Fatigue Failure under Sequential Thermal and Vibration Environments.- Solder Joint Reliability Assessment for Desktop and Space Applications.
Bibliographische Angaben
- Autoren: Andrew E. Perkins , Suresh K. Sitaraman
- 2008, 192 Seiten, Masse: 16 x 24,1 cm, Gebunden, Englisch
- Verlag: Springer
- ISBN-10: 0387793933
- ISBN-13: 9780387793931
Sprache:
Englisch
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