Managing Temperature Effects in Nanoscale Adaptive Systems
(Sprache: Englisch)
This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems. A new sensor system is described that can determine the temperature dependence as well as the operating...
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This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability. A new method is presented to control a circuit's temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time.
Klappentext zu „Managing Temperature Effects in Nanoscale Adaptive Systems “
This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability. A new method is presented to control a circuit's temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time.Inhaltsverzeichnis zu „Managing Temperature Effects in Nanoscale Adaptive Systems “
The Role of Temperature in Electronic Design.- Temperature Effects in Semiconductors.- Sensing Temperature Dependence.- Variation-Tolerant Adaptive Voltage Systems.- Controlling the Temperature Dependence.- Exploiting Temperature Dependence in Low-Swing Interconnect Links.- Avoiding Temperature-Induced Errors in On-Chip Interconnects.- Future Work and Open Problems.
Bibliographische Angaben
- Autoren: David Wolpert , Paul Ampadu
- 2011, XXII, 174 Seiten, Masse: 15,5 x 23,5 cm, Gebunden, Englisch
- Verlag: Springer, Berlin
- ISBN-10: 1461407478
- ISBN-13: 9781461407478
Sprache:
Englisch
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