Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon
(Sprache: Englisch)
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion...
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This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.
Inhaltsverzeichnis zu „Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon “
- Preface- Frequently Used Symbols
- Explanation of Frequently Used Abbreviations
- Fundamental Concepts
- Intrinsic Point Defects
- Impurity Diffusion in Silicon
- Isovalent Impurities
- Dopants
- Chalcogens
- Halogens
- List of Tables
- List of Figures
- Index.
Bibliographische Angaben
- Autor: Peter Pichler
- 2004, 2004, 554 Seiten, Masse: 17,2 x 25 cm, Gebunden, Englisch
- Verlag: Springer
- ISBN-10: 3211206876
- ISBN-13: 9783211206874
- Erscheinungsdatum: 02.06.2004
Sprache:
Englisch
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