Atom-Probe Tomography
The Local Electrode Atom Probe
(Sprache: Englisch)
In this comprehensive introduction to the use of APT in nanocharacterization, readers will find everything they need to get up to speed on the technique, from the core physics to state-of-the-art instrumentation and revised methods of data analysis.
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In this comprehensive introduction to the use of APT in nanocharacterization, readers will find everything they need to get up to speed on the technique, from the core physics to state-of-the-art instrumentation and revised methods of data analysis.
Klappentext zu „Atom-Probe Tomography “
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe - a new state-of-the-art instrument - is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
Inhaltsverzeichnis zu „Atom-Probe Tomography “
Introduction: Atom Probe Tomography.- Historical Development.- Underlying Physics.- Applications to Microstructural Characterization. Instrumentation: Local Electrode Atom Probe.- Voltage and Laser Pulsing Methods.- Nano-Positioning Stage.- Energy Compensation.- Field Ion microscopy.- Specimen Preparation.- Requirements.- Electropolishing.- FIB-Based Methods.- Specimen Failure Mechanisms.- Data Reconstruction: Raw Data Conversion.- Element Assignment of Micro/Nano, Mass Spectra, Molecular and Complex Ions.- Resolutions.- Preferential Evaporation and Retention.- Detection Efficiency.- Atom Maps.- Simulations.- Analysis of Data: Composition Determination, Standard Error, Smoothing Methods.- Local Order Methods.- Concentration Profiles.- Contingency Tables.- Binomial Distributions.- Friend-of-Friends and Nearest Neighbor Methods- Appendices.Bibliographische Angaben
- Autoren: Michael K. Miller , Richard G. Forbes
- 2014, 2014, XVIII, 423 Seiten, 62 farbige Abbildungen, Masse: 16 x 24,1 cm, Gebunden, Englisch
- Verlag: Springer, Berlin
- ISBN-10: 1489974296
- ISBN-13: 9781489974297
- Erscheinungsdatum: 02.08.2014
Sprache:
Englisch
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