Ihre Suche nach „Test Bankia“ in „Fremdsprachige Bücher“
Theory of Nonparametric Tests
Thorsten Dickhaus
Fr. 59.00
CMOS Test and Evaluation
Manjul Bhushan, Mark B. Ketchen
Fr. 201.00
.NET Test Automation Recipes
James McCaffrey
Fr. 80.50
Fr. 49.90
Build Your Own Test Framework
Daniel Irvine
Fr. 65.00
Hands-on Test-Driven Development
Greg Donald
Fr. 65.00
Electroweak Precision Tests at LEP
Wolfgang Hollik, Günter Duckeck
Fr. 59.00
Permutation Tests in Shape Analysis
Luigi Salmaso, Chiara Brombin
Fr. 59.00
Choosing the Correct Radiologic Test
Gary X. Wang, Mark A. Anderson, Lauren Uzdienski, Susanna I. Lee
Fr. 165.50
Physical Test Methods for Elastomers
Roger Brown
Fr. 212.50
The Significance Test Controversy Revisited
Bruno Lecoutre, Jacques Poitevineau
Fr. 59.00
CompTIA Security+ Practice Tests
David Seidl
Fr. 49.90
Cisco pyATS-Network Test and Automation Solution: Data-driven and reusable testing for modern networks
John Capobianco, Palmer Sample
Fr. 64.90
Test Bias in Employment Selection Testing
Thomas A. Stetz
Fr. 77.00
Test Bias in Employment Selection Testing
Thomas A. Stetz
Fr. 106.50
Thoughts on Subscription to Religious Tests,
William Frend
Fr. 44.90
Test Your Skills in C# Programming
Vaskaran Sarcar
Fr. 71.00
The Kernel Method of Test Equating
Alina A. von Davier, Paul W. Holland, Dorothy T. Thayer
Fr. 118.00
Butter Tests of Registered Jersey Cows
Anonymous
Fr. 42.90
Field-based Tests for Soccer Players
Filipe Manuel Clemente, Rafael Oliveira, Rui Silva, Zeki Akyildiz, Halil Ibrahim Ceylan, Javier Raya González, Francisco Tomás González Fernández, Rui Araújo, Hugo Sarmento, Ricardo Lima, Bruno Silva, Sérgio Matos, Yung-Sheng Chen, José Afonso
Fr. 65.00
High-Voltage Test and Measuring Techniques
Wolfgang Hauschild, Eberhard Lemke
Fr. 130.00
Push-Pull Tests for Site Characterization
Jonathan David Istok
Fr. 118.00
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Brandon Noia, Krishnendu Chakrabarty
Fr. 134.90
Fr. 36.90
Fr. 59.00
Design and Test of Dynamic Vibration Absorbers
Steven F. Griffin, Daniel J. Inman
Fr. 94.50
CTL for Test Information of Digital ICs
Rohit Kapur
Fr. 130.90
Telemetry Theory and Methods in Flight Test
Tingwu Yang
Fr. 330.50
Fr. 118.00