Transmission Electron Microscopy / Springer Series in Optical Sciences Bd.36 (PDF)
Physics of Image Formation and Microanalysis
(Sprache: Englisch)
The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed...
sofort als Download lieferbar
eBook (pdf)
Fr. 106.50
inkl. MwSt.
- Kreditkarte, Paypal, Rechnung
- Kostenloser tolino webreader
Produktdetails
Produktinformationen zu „Transmission Electron Microscopy / Springer Series in Optical Sciences Bd.36 (PDF)“
The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy.
Bibliographische Angaben
- Autor: Ludwig Reimer
- 2013, 2nd ed. 1989, 547 Seiten, Englisch
- Verlag: Springer Berlin Heidelberg
- ISBN-10: 3662215799
- ISBN-13: 9783662215791
- Erscheinungsdatum: 11.11.2013
Abhängig von Bildschirmgrösse und eingestellter Schriftgrösse kann die Seitenzahl auf Ihrem Lesegerät variieren.
eBook Informationen
- Dateiformat: PDF
- Grösse: 50 MB
- Ohne Kopierschutz
- Vorlesefunktion
Sprache:
Englisch
Kommentar zu "Transmission Electron Microscopy / Springer Series in Optical Sciences Bd.36"
0 Gebrauchte Artikel zu „Transmission Electron Microscopy / Springer Series in Optical Sciences Bd.36“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Transmission Electron Microscopy / Springer Series in Optical Sciences Bd.36".
Kommentar verfassen