Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (ePub)
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Advances in design methods and process technologies are leading to a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause timing failures on both critical and non-critical paths in the circuit.
Krishnendu Chakrabarty received the B. Tech. degree from the Indian Institute of Technology, Kharagpur, in 1990, as well as M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995, respectively. He is now Professor of Electrical and Computer Engineering at Duke University. He is also a Chair Professor of Software Theory in the School of Software, Tsinghua University, Beijing, China. Dr. Chakrabarty is a recipient of the National Science Foundation Early Faculty (CAREER) award, the Office of Naval Research Young Investigator award, the Humboldt Research Fellowship, and several best papers awards at IEEE conferences.
- 2017, 259 Seiten, Englisch
- Herausgegeben: Sandeep K. Goel, Krishnendu Chakrabarty
- Verlag: Taylor & Francis
- ISBN-10: 1351833707
- ISBN-13: 9781351833707
- Erscheinungsdatum: 19.12.2017
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- Dateiformat: ePub
- Grösse: 9.16 MB
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