Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits / The Springer International Series in Engineering and Computer Science Bd.211 (PDF)
(Sprache: Englisch)
As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with...
sofort als Download lieferbar
eBook (pdf)
Fr. 118.00
inkl. MwSt.
- Kreditkarte, Paypal, Rechnung
- Kostenloser tolino webreader
Produktdetails
Produktinformationen zu „Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits / The Springer International Series in Engineering and Computer Science Bd.211 (PDF)“
As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step toward accomplishing statistical circuit design and optimization is the development of an accurate CAD tool capable of performing statistical simulation. This tool must be based on a statistical model which comprehends the effect of device and circuit characteristics, such as device size, bias, and circuit layout, which are under the control of the circuit designer on the variability of circuit performance. The distinctive feature of the CAD tool described in this book is its ability to accurately model and simulate the effect in both intra- and inter-die process variability on analog/digital circuits, accounting for the effects of the aforementioned device and circuit characteristics. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits serves as an excellent reference for those working in the field, and may be used as the text for an advanced course on the subject.
Bibliographische Angaben
- Autoren: Christopher Michael , Mohammed Ismail
- 2012, 1993, 190 Seiten, Englisch
- Verlag: Springer, New York
- ISBN-10: 1461531500
- ISBN-13: 9781461531500
- Erscheinungsdatum: 06.12.2012
Abhängig von Bildschirmgrösse und eingestellter Schriftgrösse kann die Seitenzahl auf Ihrem Lesegerät variieren.
eBook Informationen
- Dateiformat: PDF
- Grösse: 13 MB
- Mit Kopierschutz
- Vorlesefunktion
Sprache:
Englisch
Kopierschutz
Dieses eBook können Sie uneingeschränkt auf allen Geräten der tolino Familie lesen. Zum Lesen auf sonstigen eReadern und am PC benötigen Sie eine Adobe ID.
Kommentar zu "Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits / The Springer International Series in Engineering and Computer Science Bd.211"
0 Gebrauchte Artikel zu „Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits / The Springer International Series in Engineering and Computer Science Bd.211“
Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
---|
Schreiben Sie einen Kommentar zu "Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits / The Springer International Series in Engineering and Computer Science Bd.211".
Kommentar verfassen