Semiconductor Devices in Harsh Conditions (PDF)

and Systems Society Board of Governors. Currently, she serves as vice president for technical activities for the IEEE Nanotechnology Council. She received the Best Paper Award from IEEE Alabama Section for the best IEEE Transactions paper in 1990, a 1995 Design Automation Conference Scholarship Award, and from IEEE Council on Electronic Design Automation, the 2008 Donald O. Pederson Best Paper Award in IEEE Transactions on Computer-Aided- Design of Integrated Circuits and Systems.


Kirsten Weide-Zaage is privatdozent (senior lecturer) in the field of microelectronics on the faculty of electrical engineering and computer science at the Gottfried Wilhelm Leibniz Universität in Hannover, Germany. She studied physics with a focus on biophysics, and received her PhD in electrical engineering in the field of migration effects in interconnects. In 2011, she completed her habilitation in the field of microelectronics on the simulation of failure mechanisms in chips and packaging. Since 1988, she has been working on the faculty of electrical engineering and computer science. From 1991 to 2014, Dr. Weide-Zaage was with the Information Technology Laboratory as a researcher and leader of the simulation group 'Robust Electronics', working in the field of interconnect and package reliability. In 2015, she moved with her renamed group, 'Reliability: Simulation and Risk Analysis', to the Institute of Microelectronic Systems. Her main research activities are in the field of thermal-electrical-mechanical static and dynamic simulation of microelectronic reliability. These research activities focus on diffusion processes like migration effects in interconnects, contacts, traces as well as solder, the growth of intermetallic compounds, corrosion and package simulation in terms of optimization. Another topic of the group is technology computer-aided design simulation of the behavior of transistor cells in terms of processing, mechanical stress, temperature and radiation.


Dr. Weide-Zaage has served in various roles on the technical, steering and organizing committees of international and national conferences and workshops. She is author of a book and more than 100 scientific articles, including journal and conference publications, invited papers and book chapters. In 2010, she received a best paper award from the European Symposium on Reliability of Electron Devices.