Secondary Ion Mass Spectrometry (ePub)
An Introduction to Principles and Practices
(Sprache: Englisch)
Serves as a practical reference for those involved in Secondary Ion
Mass Spectrometry (SIMS)
* Introduces SIMS along with the highly diverse fields
(Chemistry, Physics, Geology and Biology) to it is applied using up
to date illustrations
*...
Mass Spectrometry (SIMS)
* Introduces SIMS along with the highly diverse fields
(Chemistry, Physics, Geology and Biology) to it is applied using up
to date illustrations
*...
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Produktinformationen zu „Secondary Ion Mass Spectrometry (ePub)“
Serves as a practical reference for those involved in Secondary Ion
Mass Spectrometry (SIMS)
* Introduces SIMS along with the highly diverse fields
(Chemistry, Physics, Geology and Biology) to it is applied using up
to date illustrations
* Introduces the accepted fundamentals and pertinent
models associated with elemental and molecular sputtering and ion
emission
* Covers the theory and modes of operation of the
instrumentation used in the various forms of SIMS (Static vs
Dynamic vs Cluster ion SIMS)
* Details how data collection/processing can be carried
out, with an emphasis placed on how to recognize and avoid commonly
occurring analysis induced distortions
* Presented as concisely as believed possible with All
sections prepared such that they can be read independently of each
other
Mass Spectrometry (SIMS)
* Introduces SIMS along with the highly diverse fields
(Chemistry, Physics, Geology and Biology) to it is applied using up
to date illustrations
* Introduces the accepted fundamentals and pertinent
models associated with elemental and molecular sputtering and ion
emission
* Covers the theory and modes of operation of the
instrumentation used in the various forms of SIMS (Static vs
Dynamic vs Cluster ion SIMS)
* Details how data collection/processing can be carried
out, with an emphasis placed on how to recognize and avoid commonly
occurring analysis induced distortions
* Presented as concisely as believed possible with All
sections prepared such that they can be read independently of each
other
Autoren-Porträt von Paul van der Heide
Paul van der Heide is a recognized leader in surfaceanalysis with emphasis on the application of Secondary Ion Mass
Spectrometry (SIMS). This interest started during his PhD
(completed in 1992 at the University of Auckland) which involved
the design and construction of a magnetic sector SIMS instrument.
Paul has since been heavily involved in the application and
development of SIMS at the University of Western Ontario, the
University of Houston (where he also filled in various Professor
level positions), Samsung Austin Semiconductor, and most recently
at GlobalFoundries (NY). Paul has ~100 publications with this
representing his 2nd book.
Bibliographische Angaben
- Autor: Paul van der Heide
- 2014, 1. Auflage, 384 Seiten, Englisch
- Verlag: John Wiley & Sons
- ISBN-10: 1118916778
- ISBN-13: 9781118916773
- Erscheinungsdatum: 19.08.2014
Abhängig von Bildschirmgrösse und eingestellter Schriftgrösse kann die Seitenzahl auf Ihrem Lesegerät variieren.
eBook Informationen
- Dateiformat: ePub
- Grösse: 13 MB
- Mit Kopierschutz
Sprache:
Englisch
Kopierschutz
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