Secondary Ion Mass Spectrometry SIMS IV / Springer Series in Chemical Physics Bd.36 (PDF)
Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983
(Sprache: Englisch)
This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or ganizing committee under the...
sofort als Download lieferbar
eBook (pdf)
Fr. 118.00
inkl. MwSt.
- Kreditkarte, Paypal, Rechnung
- Kostenloser tolino webreader
Produktdetails
Produktinformationen zu „Secondary Ion Mass Spectrometry SIMS IV / Springer Series in Chemical Physics Bd.36 (PDF)“
This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or ganizing committee under the auspices of the international organizing com mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rap idly expanding activities in the SIMS field, informative papers were pre sented containing up-to-date information on SIMS and various related fields. The proceedings focussed upon six main issues: (1) Fundamentals of sput tering and secondary ion formation. (2) Recent progress in instrumentation, including submicron SIMS and image processing. (3) SIMS combined with other surface analysis techniques. (4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS. (5) Organic SIMS and FAB which has recently become a rapidly expanding technique in pharmacy, biotechnology, etc. (6) Appl ica tions of SIMS to various fields such as metallurgy, geology, and biology, including depth profiling of semiconductors, and analysis of inorganic mate rials. As a venue for the exchange of ideas and information concerning all the above issues, the conference proved a great success.
Bibliographische Angaben
- 2012, 1984, 506 Seiten, Englisch
- Herausgegeben: A. Benninghoven, J. Okano, R. Shimizu, H. W. Werner
- Verlag: Springer Berlin Heidelberg
- ISBN-10: 3642822568
- ISBN-13: 9783642822568
- Erscheinungsdatum: 06.12.2012
Abhängig von Bildschirmgrösse und eingestellter Schriftgrösse kann die Seitenzahl auf Ihrem Lesegerät variieren.
eBook Informationen
- Dateiformat: PDF
- Grösse: 41 MB
- Ohne Kopierschutz
- Vorlesefunktion
Sprache:
Englisch
Kommentar zu "Secondary Ion Mass Spectrometry SIMS IV / Springer Series in Chemical Physics Bd.36"
0 Gebrauchte Artikel zu „Secondary Ion Mass Spectrometry SIMS IV / Springer Series in Chemical Physics Bd.36“
Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
---|
Schreiben Sie einen Kommentar zu "Secondary Ion Mass Spectrometry SIMS IV / Springer Series in Chemical Physics Bd.36".
Kommentar verfassen