New Horizons of Applied Scanning Electron Microscopy / Springer Series in Surface Sciences Bd.45 (PDF)

Name: New Horizons of Applied Scanning Electron Microscopy / Springer Series in Surface Sciences Bd.45
Brand: Springer-Verlag GmbH
SKU: 29678542
Price: 118.00 CHF
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(Sprache: Englisch)

Autoren: Kenichi Shimizu , Tomoaki Mitani

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New Horizons of Applied Scanning Electron Microscopy / Springer Series in Surface Sciences Bd.45, Kenichi Shimizu, Tomoaki Mitani

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In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

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Autoren: Kenichi Shimizu , Tomoaki Mitani
2009, 2010, 182 Seiten, Englisch
Verlag: Springer-Verlag GmbH
ISBN-10: 3642031609
ISBN-13: 9783642031601
Erscheinungsdatum: 19.11.2009

Abhängig von Bildschirmgrösse und eingestellter Schriftgrösse kann die Seitenzahl auf Ihrem Lesegerät variieren.

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Dateiformat: PDF
Grösse: 9.67 MB
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Englisch

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From the reviews:“The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. … In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed.” (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)

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