Modern Map Methods in Particle Beam Physics (ePub)
(Sprache: Englisch)
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices...
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Produktinformationen zu „Modern Map Methods in Particle Beam Physics (ePub)“
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Bibliographische Angaben
- 1999, 318 Seiten, Englisch
- Herausgegeben: Martin Berz, Kyoko Makino, Khodr Shamseddine
- Verlag: Elsevier Science & Techn.
- ISBN-10: 0080577741
- ISBN-13: 9780080577746
- Erscheinungsdatum: 22.09.1999
Abhängig von Bildschirmgrösse und eingestellter Schriftgrösse kann die Seitenzahl auf Ihrem Lesegerät variieren.
eBook Informationen
- Dateiformat: ePub
- Grösse: 6.15 MB
- Mit Kopierschutz
- Vorlesefunktion
Sprache:
Englisch
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Pressezitat
PRAISE FOR THE SERIES"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
-MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
-J.A. Chapman in LABORATORY PRACTICE
Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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