Microstructural Characterization of Materials (PDF)

Microstructural characterization is usually achieved by allowing
some form of probe to interact with a carefully prepared specimen.
The most commonly used probes are visible light, X-ray radiation, a
high-energy electron beam, or a sharp, flexible needle. These four
types of probe form the basis for optical microscopy, X-ray
diffraction, electron microscopy, and scanning probe
microscopy.

Microstructural Characterization of Materials, 2nd Edition
is an introduction to the expertise involved in assessing the
microstructure of engineering materials and to the experimental
methods used for this purpose. Similar to the first edition, this
2nd edition explores the methodology of materials characterization
under the three headings of crystal structure, microstructural
morphology, and microanalysis. The principal methods of
characterization, including diffraction analysis, optical
microscopy, electron microscopy, and chemical microanalytical
techniques are treated both qualitatively and quantitatively. An
additional chapter has been added to the new edition to cover
surface probe microscopy, and there are new sections on digital
image recording and analysis, orientation imaging microscopy,
focused ion-beam instruments, atom-probe microscopy, and 3-D image
reconstruction. As well as being fully updated, this second edition
also includes revised and expanded examples and exercises, with a
solutions manual available at
http://develop.wiley.co.uk/microstructural2e/

Microstructural Characterization of Materials, 2nd Edition
will appeal to senior undergraduate and graduate students of
material science, materials engineering, and materials chemistry,
as well as to qualified engineers and more advanced researchers,
who will find the book a useful and comprehensive general
reference source.