Handbook of Surface and Nanometrology (PDF)
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Regarded as one of the world's top authorities on surface and nanometrology, David J. Whitehouse is professor emeritus of engineering science at the University of Warwick, where he was chief scientist in the School of Engineering. He has also been a consultant to numerous organizations, such as Rolls Royce, Taylor Hobson, Kodak, Unilever, General Motors, Caterpillar, 3M, Toshiba Japan, UBM Germany, and the Atomic Weapons Research Establishment. He has published 5 books and more than 250 technical papers, holds 23 patents, and was founding editor of the first peer-reviewed international journal on nanoscale science and technology, Nanotechnology. Professor Whitehouse has been a recipient of many awards, including the Lifetime Achievement Award from the American Society for Precision Engineering, the Champion of Metrology award from the National Physical Laboratory, and the Commemorative Medallion of the Mendeleev Institute of Metrology.
- Autor: David J. Whitehouse
- 2010, 2. Auflage, 999 Seiten, Englisch
- Verlag: Taylor & Francis
- ISBN-10: 1420082027
- ISBN-13: 9781420082029
- Erscheinungsdatum: 20.12.2010
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- Dateiformat: PDF
- Grösse: 43 MB
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