Cluster Secondary Ion Mass Spectrometry / Wiley-Interscience Series on Mass Spectrometry (PDF)

Explores the impact of the latest breakthroughs in cluster
SIMS technology

Cluster secondary ion mass spectrometry (SIMS) is a high spatial
resolution imaging mass spectrometry technique, which can be used
to characterize the three-dimensional chemical structure in complex
organic and molecular systems. It works by using a cluster ion
source to sputter desorb material from a solid sample surface.
Prior to the advent of the cluster source, SIMS was severely
limited in its ability to characterize soft samples as a result of
damage from the atomic source. Molecular samples were essentially
destroyed during analysis, limiting the method's sensitivity and
precluding compositional depth profiling. The use of new and
emerging cluster ion beam technologies has all but eliminated these
limitations, enabling researchers to enter into new fields once
considered unattainable by the SIMS method.

With contributions from leading mass spectrometry researchers
around the world, Cluster Secondary Ion Mass Spectrometry:
Principles and Applications describes the latest breakthroughs
in instrumentation, and addresses best practices in cluster SIMS
analysis. It serves as a compendium of knowledge on organic and
polymeric surface and in-depth characterization using cluster ion
beams. It covers topics ranging from the fundamentals and theory of
cluster SIMS, to the important chemistries behind the success of
the technique, as well as the wide-ranging applications of the
technology. Examples of subjects covered include:

* Cluster SIMS theory and modeling

* Cluster ion source types and performance expectations

* Cluster ion beams for surface analysis experiments

* Molecular depth profiling and 3-D analysis with cluster ion
beams

* Specialty applications ranging from biological samples analysis
to semiconductors/metals analysis

* Future challenges and prospects for cluster SIMS

This book is intended to benefit any scientist, ranging from
beginning to advanced in level, with plenty of figures to help
better understand complex concepts and processes. In addition, each
chapter ends with a detailed reference set to the primary
literature, facilitating further research into individual topics
where desired. Cluster Secondary Ion Mass Spectrometry:
Principles and Applications is a must-have read for any
researcher in the surface analysis and/or imaging mass spectrometry
fields.