Advanced VLSI Design and Testability Issues (ePub)
(Sprache: Englisch)
This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation...
sofort als Download lieferbar
eBook (ePub)
Fr. 65.90
inkl. MwSt.
- Kreditkarte, Paypal, Rechnung
- Kostenloser tolino webreader
Produktdetails
Produktinformationen zu „Advanced VLSI Design and Testability Issues (ePub)“
This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.
Autoren-Porträt
Suman Lata Tripathi is associated with Lovely Professional University, Phagwara, Punjab, as Professor with more than seventeen years of experience in academics. Her area of expertise includes microelectronics device modeling and characterization, low power VLSI circuit design, VLSI design of testing and advance FET design for IOT and biomedical applications etc. Sobhit Saxena is an Associate Professor at Lovely Professional University University, Phagwara, Punjab. His area of expertise includes nanomaterial synthesis and characterization, electrochemical analysis and modeling and simulation of CNT based interconnects for VLSI circuits.
S. K. Mohapatra is working as Assistant Professor, in School of Electronics Engineering, Kalinga Institute of Industrial Technology, Bhubaneswar. His research interests include Modeling and Simulation of Nanoscale Devices and its application in IoT. Energy efficient Wireless Sensor Networking, Adhoc Networks, Cellular Communications, Metamaterial absorbers in THz application, UWB-MIMO Antenna, Reconfigurable Antenna, Performance enhancement for high frequency.
Bibliographische Angaben
- 2020, 1. Auflage, 378 Seiten, Englisch
- Herausgegeben: Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra
- Verlag: Taylor & Francis
- ISBN-10: 1000168174
- ISBN-13: 9781000168174
- Erscheinungsdatum: 18.08.2020
Abhängig von Bildschirmgrösse und eingestellter Schriftgrösse kann die Seitenzahl auf Ihrem Lesegerät variieren.
eBook Informationen
- Dateiformat: ePub
- Grösse: 14 MB
- Ohne Kopierschutz
- Vorlesefunktion
Sprache:
Englisch
Kommentar zu "Advanced VLSI Design and Testability Issues"
0 Gebrauchte Artikel zu „Advanced VLSI Design and Testability Issues“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Advanced VLSI Design and Testability Issues".
Kommentar verfassen