Advanced Laser Diode Reliability (ePub)
(Sprache: Englisch)
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current...
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Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
- Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda
- Present the extension to new failure mechanisms, new technologies, new application fields, new environments
- Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
Autoren-Porträt von Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda, Giovanna Mura
Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices
Bibliographische Angaben
- Autoren: Massimo Vanzi , Laurent Bechou , Mitsuo Fukuda , Giovanna Mura
- 2021, 268 Seiten, Englisch
- Verlag: Elsevier Science & Techn.
- ISBN-10: 0081010893
- ISBN-13: 9780081010891
- Erscheinungsdatum: 30.07.2021
Abhängig von Bildschirmgrösse und eingestellter Schriftgrösse kann die Seitenzahl auf Ihrem Lesegerät variieren.
eBook Informationen
- Dateiformat: ePub
- Grösse: 16 MB
- Mit Kopierschutz
- Vorlesefunktion
Sprache:
Englisch
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