Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
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(Sprache: Englisch)
Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures....
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Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
Klappentext zu „Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space “
Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
Bibliographische Angaben
- Autor: Mahtab Niknahad
- 2013, IX, 160 Seiten, mit Abbildungen, Masse: 17 x 24 cm, Kartoniert (TB), Englisch
- Verlag: KIT Scientific Publishing
- ISBN-10: 3731500388
- ISBN-13: 9783731500384
Sprache:
Englisch
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