Theory and Practice of Thermal Transient Testing of Electronic Components

Introduction: the Importance and Motivation.- Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature.- The Use of Thermal Transient Testing.- General Practical Questions and the Flow of Thermal Transient Measurements.- On the Accuracy and Repeatability of Thermal Measurements.

Márta Rencz, Ph.D., is a Professor and former Head of the Department of Electron Devices at the Budapest University of Technology and Economics. Dr. Rencz also holds a Research Director position with Mentor, a Siemens Business. She received her undergraduate and master's degrees in electrical engineering and a Ph.D. from the Technical University of Budapest, Hungary, a Doctor of Science degree from The Hungarian Academy of Science, and a Doctor Honoris Causa degree from the Technical University of Tallinn. Her latest research interests include the thermal investigation of ICs and MEMS, thermal sensors, thermal testing, thermal simulation, multiphysics model generation, and electro-thermal simulation. Dr. Rencz received the Harvey Rosten Award of Excellence for her research results in thermal modeling and the ASME Allan Krauss Thermal Management Medal for her contributions to the scientific and academic world of thermal transient testing, in particular, her work on thermal metrology, including thermal test, characterization, and analysis of semiconductor devices and packages. She is a Program Committee member for several international conferences and workshops and a guest editor of special issues at leading scientific journals. She has published her theoretical and practical results in more than 350 technical papers.

Gábor Farkas, Ph.D., received his MSc in electrical engineering in 1976 and his Ph.D. in 1981 at the Budapest University of Technology and Economics, Hungary, specializing in technical physics. Since then, Dr. Farkas has worked in various fields of microelectronics, from device design to circuit testing. He was visiting scholar at several European universities. His current research focus is on testing high-power devices. He has published his research results in over 100 technical papers.
András Poppe, Ph.D., received his MSc in electrical engineering in 1986 and his Ph.D. in 1996 at the Budapest University of Technology and