RADIATION EFFECTS ON EMBEDDED
(Sprache: Englisch)
This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School...
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This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
Inhaltsverzeichnis zu „RADIATION EFFECTS ON EMBEDDED “
1. Space Radiation Environment2.Radiation Effects in Microelectronics
3.In-flight anomalies on electronic devices
4.Multi-Level Fault Effects Evaluation
5.Effects of Radiation on Analog & Mixed-Signal Circuits
6.Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing
7.Design hardening methodologies for ASICs
8.Fault Tolerance in Programmable Circuits
9.Automatic Tools for Design Hardening
10.Test Facilities for SEE and Dose Testing
11.Error Rate Prediction of Digital Architectures: Test Methodology and Tools
12. Using the SEEM software for laser SET testing and analysis
Bibliographische Angaben
- VIII, 269 Seiten, Masse: 16,4 x 24,4 cm, Gebunden, Englisch
- Herausgegeben: Raoul Velazco, Pascal Fouillat, Ricardo Reis
- Verlag: Springer Netherland
- ISBN-10: 1402056451
- ISBN-13: 9781402056451
- Erscheinungsdatum: 04.06.2007
Sprache:
Englisch
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