Nyquist AD Converters, Sensor Interfaces, and Robustness
Advances In Analog Circuit Design, 2012
(Sprache: Englisch)
Written by experts in industry and academia, this collection of tutorials, originally presented to the 21st workshop on Advances in Analog Circuit Design, covers Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
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Written by experts in industry and academia, this collection of tutorials, originally presented to the 21st workshop on Advances in Analog Circuit Design, covers Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
Klappentext zu „Nyquist AD Converters, Sensor Interfaces, and Robustness “
This book is based on the 18 presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.
Inhaltsverzeichnis zu „Nyquist AD Converters, Sensor Interfaces, and Robustness “
Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuits for MEMS Microphones.- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments.- Part III: Robustness.- How Can Chips Live Under Radiation?.- TDC and Rad Environments.- Matching and Resolution.- Matching in Polymer and Effect on Circuit Topologies.- Statistical Variability and Reliability in Nano-CMOS Transistors.
Bibliographische Angaben
- 2013, X, 294 Seiten, Masse: 17 x 24,2 cm, Gebunden, Englisch
- Herausgegeben: Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert
- Verlag: Springer, Berlin
- ISBN-10: 1461445868
- ISBN-13: 9781461445869
Sprache:
Englisch
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