New Horizons of Applied Scanning Electron Microscopy
(Sprache: Englisch)
In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.
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Produktinformationen zu „New Horizons of Applied Scanning Electron Microscopy “
In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.
Klappentext zu „New Horizons of Applied Scanning Electron Microscopy “
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
Inhaltsverzeichnis zu „New Horizons of Applied Scanning Electron Microscopy “
Introduction.- Imaging of Thin Films.- Applications of Scanning Electron Microscopy.- Concluding remarks.
Bibliographische Angaben
- Autoren: Kenichi Shimizu , Tomoaki Mitani
- 2013, XIV, 182 Seiten, 25 farbige Abbildungen, Masse: 15,5 x 23,5 cm, Kartoniert (TB), Englisch
- Verlag: Springer, Berlin
- ISBN-10: 364226168X
- ISBN-13: 9783642261688
Sprache:
Englisch
Pressezitat
From the reviews:"The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. ... In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed." (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)
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