Near-field Nano/Atom Optics and Technology
(Sprache: Englisch)
Intrinsic features of the optical near field open a new frontier in optical science and technology by finally overcoming the diffraction limit to reach nanometric dimensions. But this book goes beyond near-field optical microscopy to cover local...
Voraussichtlich lieferbar in 3 Tag(en)
versandkostenfrei
Buch (Kartoniert)
Fr. 118.00
inkl. MwSt.
- Kreditkarte, Paypal, Rechnungskauf
- 30 Tage Widerrufsrecht
Produktdetails
Produktinformationen zu „Near-field Nano/Atom Optics and Technology “
Klappentext zu „Near-field Nano/Atom Optics and Technology “
Intrinsic features of the optical near field open a new frontier in optical science and technology by finally overcoming the diffraction limit to reach nanometric dimensions. But this book goes beyond near-field optical microscopy to cover local spectroscopy, nanoscale optical processing and storage, quantum near-field optics, and atom manipulation. Near-Field Nano/Atom Optics and Technology provides the first complete and systematically compiled account of the science and technology required to generate the near field, and features applications including imaging of biological specimens and diagnostics for semiconductor nanomaterials and devices. This monograph will be invaluable to researchers who want to implement near-field technology in their own work, and it can also be used as a textbook for graduate or undergraduate students.
Inhaltsverzeichnis zu „Near-field Nano/Atom Optics and Technology “
1. Introduction.- 1.1 Near-Field Optics and Related Technologies.- 1.2 History of Near-Field Optics and Related Technologies.- 1.3 Basic Features of an Optical Near Field.- 1.3.1 Optically "Near" System.- 1.3.2 Effective Field and Evanescent Field.- 1.3.3 Near-Field Detection of Effective Fields.- 1.3.4 Role of a Probe Tip.- 1.4 Building Blocks of Near-Field Optical Systems.- 1.5 Comments on the Theory of Near-Field Optics.- 1.6 Composition of This Book.- References.- 2. Principles of the Probe.- 2.1 Basic Probe.- 2.1.1 Optical Fiber Probe for the Near-Field Optical Microscope.- 2.1.2 Principle of the Imaging Mechanism: Dipole-Dipole Interaction.- 2.1.3 Resolution.- 2.1.4 Contrast.- 2.1.5 Sensitivity.- 2.2 Functional Probe: New Contrast Mechanisms.- 2.2.1 Signal Conversion by Functional Probes.- 2.2.2 Absorption and Emission: Radiative and Nonradiative Energy Transfer.- 2.2.3 Resonance, Nonlinearity, and Other Mechanisms.- References.- 3. Probe Fabrication.- 3.1 Introduction.- 3.2 Selective Etching of a Silica Fiber Composed of a Core and Cladding.- 3.2.1 Geometrical Model of Selective Etching.- 3.2.2 Pure Silica Fiber with a Fluorine Doped Cladding.- 3.2.3 GeO2 Doped Fiber.- 3.2.4 Tapered Fibers for Optical Transmission Systems.- 3.3 Selective Etching of a Dispersion Compensating Fiber.- 3.3.1 Shoulder-Shaped Probe.- 3.3.1.1 Shoulder-Shaped Probe with a Controlled Cladding Diameter.- 3.3.1.2 Shoulder-Shaped Probe with a Nanometric Flattened Apex.- 3.3.1.3 Double-Tapered Probe.- 3.3.2 Pencil-Shaped Probe.- 3.3.2.1 Pencil-Shaped Probe with an Ultra-Small Cone Angle.- 3.3.2.2 Pencil-Shaped Probe with a Nanometric Apex Diameter.- 3.4 Protrusion-Type Probe.- 3.4.1 Selective Resin Coating Method.- 3.4.2 Chemical Polishing Method.- 3.5 Hybrid Selective Etching of a Double-Cladding Fiber.- 3.5.1 Triple-Tapered Probe.- 3.5.2 Geometrical Model of Selective Etching of a Double-Cladding Fiber.- 3.5.3 Application-Oriented Probes: Pencil-Shaped Probe and Triple-Tapered Probe.-
... mehr
3.6 Probe for Ultraviolet NOM Applications.- 3.6.1 UV Single-Tapered Probe.- 3.6.2 UV Triple-Tapered Probe.- 3.6.2.1 Advanced Method Based on Hybrid Selective Etching of a Double Core Fiber.- 3.6.2.2 Geometrical Model.- References.- 4. High-Throughput Probes.- 4.1 Introduction.- 4.2 Excitation of the HE-Plasmon Mode.- 4.2.1 Mode Analysis.- 4.2.2 Edged Probes for Exciting the HE-Plasmon Mode.- 4.3 Multiple-Tapered Probes.- 4.3.1 Double-Tapered Probe.- 4.3.2 Triple-Tapered Probe.- References.- 5. Functional Probes.- 5.1 Introduction.- 5.2 Methods of Fixation.- 5.3 Selecting a Functional Material.- 5.4 Probe Characteristics and Applications.- 5.4.1 Dye-Fixed Probes.- 5.4.2 Chemical Sensing Probes.- 5.5 Future Directions.- References.- 6. Instrumentation of Near-Field Optical Microscopy.- 6.1 Operation Modes of NOM.- 6.1.1 c-Mode NOM.- 6.1.2 i-Mode NOM.- 6.1.3 Comparative Features of Modes of NOM.- 6.2 Scanning Control Modes.- 6.2.1 Constant-height Mode.- 6.2.2 Constant-Distance Mode.- 6.2.2.1 Shear-force Feed Back.- 6.2.2.2 Optical Near-Field Intensity Feedback.- References.- 7. Basic Features of Optical Near-Field and Imaging.- 7.1 Resolution Characteristics.- 7.1.1 Longitudinal Resolution.- 7.1.2 Lateral Resolution.- 7.2 Factors Influencing Resolution.- 7.2.1 Influence of Probe Parameters.- 7.2.2 Dependence on Sample-Probe Separation.- 7.3 Polarization Dependence.- 7.3.1 Influence of Polarization on the Images of an Ultrasmooth Sapphire Surface.- 7.3.2 Influence of Polarization on the Images of LiNbO3 Nanocrystals.- References.- 8. Imaging Biological Specimens.- 8.1 Introduction.- 8.2 Observation of Flagellar Filaments by c-Mode NOM.- 8.2.1 Imaging in Air.- 8.2.2 Imaging in Water.- 8.3 Observation of Subcellular Structures of Neurons by i-Mode NOM.- 8.3.1 Imaging in Air Under Shear-Force Feedback.- 8.3.1.1 Imaging of Neurons Without Dye Labeling.- 8.3.1.2 Imaging of Neurons Labeled with Toluidine Blue.- 8.3.2 Imaging in Water Under Optical Near-Field Intensity Fee
... weniger
Bibliographische Angaben
- 2012, Softcover reprint of the original 1st ed. 1998, 302 Seiten, Masse: 15,5 x 23,5 cm, Kartoniert (TB), Englisch
- Herausgegeben: Motoichi Ohtsu
- Verlag: Springer, Berlin
- ISBN-10: 4431680136
- ISBN-13: 9784431680130
Sprache:
Englisch
Kommentar zu "Near-field Nano/Atom Optics and Technology"
0 Gebrauchte Artikel zu „Near-field Nano/Atom Optics and Technology“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Near-field Nano/Atom Optics and Technology".
Kommentar verfassen