Advances in X-Ray Analysis
Volume 2 Proceedings of the Seventh Annual Conference on Applications of X-Ray Analysis Held August 13-15, 1958
(Sprache: Englisch)
The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus...
Voraussichtlich lieferbar in 3 Tag(en)
versandkostenfrei
Buch (Kartoniert)
Fr. 59.00
inkl. MwSt.
- Kreditkarte, Paypal, Rechnungskauf
- 30 Tage Widerrufsrecht
Produktdetails
Produktinformationen zu „Advances in X-Ray Analysis “
Klappentext zu „Advances in X-Ray Analysis “
The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur red of representatives from industrial laboratories, universities, and manu facturers of x-ray equipment. Papers which deal with the fundamental as pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.
Inhaltsverzeichnis zu „Advances in X-Ray Analysis “
Annealing Texture in a Rolled and Artificially Nucleated Aluminum Single Crystal.- Substructure Characteristics of Fine-Grained Metals and Alloys Disclosed by X-Ray Microscopy and Diffraction Analysis.- I-Description and Application of Diffraction Method.- II-Description of X-Ray Double-Crystal Diffractometer Combining X-Ray Microscopy and Diffraction Analysis.- On the Mechanism of Recrystallization of Aluminum.- Some X-Ray Observations on the Oxidation Characteristics of Binary Niobium Alloys.- Selection of Spectra for X-Ray Microscopy.- The Crystallography of Compounds in the Calcium Oxide-Niobium Pentoxide System.- Instrumentation for X-Ray Diffraction Studies of Highly Radioactive Samples.- Microstructure, Mass and Chemical Analysis with 8 to 44 Angstrom X-Radiation.- Fluorescent X-Ray Analysis of Highly Radioactive Samples.- Further Application of the Intermediate X-Ray Probe.- Determination of Uranium in Flotation Concentrates and in Leach Liquors by X-Ray Fluorescence.- X-Ray Spectrographic Determination of Uranium and Plutonium in Aluminum and Other Reactor Fuel Materials.- The Evaluation of the PXQ for the Analysis of Cements and Related Materials.- A Novel Approach to Discrimination in X-Ray Spectrographic Analysis.- Crystal Chemical Studies by X-Ray Fluorescence.- An Application of the Mutual Standards Concept to X-Ray Fluorescence Spectroscopy: The Analysis of Meteoritic Sulphide Nodules for Eight Elements.- Quantitative Analysis of Trace Amounts of Tin in Steel by Means of X-Ray Fluorescence.- Techniques for X-Ray Diffraction Studies of Radioactive Materials.- Cladding Thickness of Fuel Elements by X-Rays.- X-Ray Projection Microradiography and Divergent Beam Techniques.- A Universal Detector for the X-Ray Spectrograph.- Recent Developments inFluorescent X-Ray Spectrographic-Absorptiometric Analyses of Mineral Systems.- Determination of Calcium in Wolframite Concentrates by Fluorescent X-Ray Spectrography.- X-Ray Emission Spectrographic Analysis of
... mehr
High-Purity Rare-Earth Oxides.- Recrystallization Studies of High Purity Aluminum Single Crystals.
... weniger
Bibliographische Angaben
- Autor: William M. Mueller
- 2013, Softcover reprint of the original 1st ed. 1960, VI, 353 Seiten, Masse: 15,2 x 22,9 cm, Kartoniert (TB), Englisch
- Verlag: Springer, Berlin
- ISBN-10: 1468486330
- ISBN-13: 9781468486339
Sprache:
Englisch
Kommentar zu "Advances in X-Ray Analysis"
0 Gebrauchte Artikel zu „Advances in X-Ray Analysis“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Advances in X-Ray Analysis".
Kommentar verfassen