Advances in X-Ray Analysis
Volume 8
(Sprache: Englisch)
A real need exists for ways to bridge the gap between basic research and prac tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish ments to...
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Klappentext zu „Advances in X-Ray Analysis “
A real need exists for ways to bridge the gap between basic research and prac tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish ments to the civilian economy. The problem is compounded by the torrential flow of technical information. Thirty million books are available on technical subjects, the total increasing at the rate of six hundred every day. There are one hundred thousand technical journals. More scientific work has been published in the past ten years than in all preceding recorded history. Scientists and engineers only a few years beyond academic pursuits are already encountering a continuing need for retraining and expansion of their own knowledge. At the same time, the re searchers - scientists, engineers, students - must exhibit bold creative thinking to evolve new technology, to better understand nature's secrets, to conceive new theories, and to reduce old theories to practical utilization. Research in the physical sciences and the engineering sciences provides the ever-flowing spring of knowledge for the investigation of new ideas. Such research is sometimes hindered by classification as "basic" or "applied. " There are many times when a research program has no immediate or ultimate objective and is truly contributing to our reservoir of knowledge - a reservoir which will certainly be tapped in the future.
Inhaltsverzeichnis zu „Advances in X-Ray Analysis “
Double-Scanning Diffractometry in the Back-Reflection Region.- Determination of Lattice Constants of Polycrystalline (Monoclinic) Uranium Tetrafluoride.- The Use of a Portable X-Ray Unit for Measuring Residual Stresses in Aluminum, Titanium, and Steel Alloys.- Experimental X-Ray Stress Analysis Procedures for Ultrahigh-Strength Materials.- A Study of Defects Due to Surface Processing in Silicon by Means of X-Ray Extinction Contrast Topography.- Small-Angle X-Ray Scattering by Metastable Liquid Immiscibility in Glass.- High-Temperature Modifications of Thorium Dicarbide.- An Ultrahigh Temperature, Single-Crystal Texture Camera Diffractometer.- Ternary Carbide Phases Formed by Scandium-Group Elements with Aluminum and Carbon.- X-Ray Diffraction of Nonmetallic Phases Chemically Extracted from Columbium Alloys.- Escape Peaks in X-Ray Diffractometry.- A Computer Program for Determining Accurate Parameters from Powder Data.- Oxidation of Zirconium-Yttrium Alloys.- X-Ray Diffractometry of Polymers by a Transmission Method.- Diffraction Maxima Positions in Two Types of Liquid Organosilicon Compounds.- Modification of Collagen and Nylon Lattices by Resorcinol.- An Automated System for Extended X-Ray Absorption Measurements.- X-Ray Generation by Proton Bombardment.- A Compilation of Beta-Ray Stimulated X-Ray Spectra.- Some Instrumental Considerations in the Automatic On-Stream Analysis of Pulps for Elemental Content.- An Instrument for Soft X-Ray Selected-Area Microdiffraction.- A New Focusing Vacuum X-Ray Macroprobe Analyzer.- Evaluation and Application of an Improved Slit Probe for the X-Ray Secondary Emission Spectrometer.- The Use of an X-Ray Fluorescence Semi-Microprobe Attachment in Metallurgy.- The Application of X-Ray Fluorescence Probe Analysis to the Study of Segregation in Steels.- Some Notes on Ultrasoft X-Ray Fluorescence Analysis - 10 to 100 Å Region.- A Polycrystalline X-Ray Analyzing Crystal.- The Effect of Grating Blaze Angle on the Diffraction Efficiency of
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Ultrasoft X-Ray Radiation.- Preliminary Studies on the Characterization of Solution-Grown ADP Crystals.- The Diffraction of X-Rays by Multilayer Stearate Soap Films.- Some Measurements of Carbon K Excitation in a New Ultrasoft X-Ray Spectrometer.- Light Element Analysis with an Electron Microprobe.- Microprobe Analysis of Binary Systems Containing Uranium.- The Study of Electrical Contact Surfaces with an Electron Probe Microanalyzer.- The Effect of Valence and Coordination on K Series Diagram and Nondiagram Lines of Magnesium, Aluminum, and Silicon.- Some Observations on X-Ray Emission as a Function of Accelerating Voltage in the Microprobe.- A Lunar X-Ray Diffraction Experiment.- A Study of Homogeneity of Solid Solutions of Cadmium Sulfide and Cadmium Selenide by X-Ray Fluorescence.- Variation of X-Ray Spectral Line Position with Ambient-Temperature Change: A Source of Error in X-Ray Spectrography.- Determination of Rubidium in Cesium Metal by X-Ray Fluorescence Spectroscopy.- The Determination of Calcium in Uranium Ore Concentrates by X-Ray Fluorescence.- X-Ray Fluorescence in Cotton Modification Research.
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Bibliographische Angaben
- Autoren: William M. Mueller , Gavin Mallet , Marie Fay
- 2012, Softcover reprint of the original 1st ed. 1965, XIII, 472 Seiten, 5 farbige Abbildungen, Masse: 17,8 x 25,4 cm, Kartoniert (TB), Englisch
- Verlag: Springer, Berlin
- ISBN-10: 1468486756
- ISBN-13: 9781468486759
Sprache:
Englisch
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