Thermal Conductivity Measurements in Atomically Thin Materials and Devices / SpringerBriefs in Applied Sciences and Technology (PDF)

Name: Thermal Conductivity Measurements in Atomically Thin Materials and Devices / SpringerBriefs in Applied Sciences and Technology
Brand: Springer-Verlag GmbH
SKU: 133100898
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(Sprache: Englisch)

Autor: T. Serkan Kasirga

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This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.

Autoren-Porträt von T. Serkan Kasirga

Dr. Kasirga completed his Ph.D. in December 2013 and right after moved to Bilkent University as an Assistant Prof. Since 2015 he has been serving as associate director of the National Nanotechnology Research Center at Bilkent University. His research interests are in the area of strongly correlated systems and 2D materials.

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Autor: T. Serkan Kasirga
2020, 1st ed. 2020, 50 Seiten, Englisch
Verlag: Springer-Verlag GmbH
ISBN-10: 9811553483
ISBN-13: 9789811553486
Erscheinungsdatum: 19.05.2020

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