The Spectroscopy of Semiconductors (PDF)
Volume 36
(Sprache: Englisch)
Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors...
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Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures.
Key Features
* Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors
* Features detailed review articles which cover basic principles
* Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures
Key Features
* Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors
* Features detailed review articles which cover basic principles
* Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures
Bibliographische Angaben
- 1992, 435 Seiten, Englisch
- Verlag: Elsevier Science & Techn.
- ISBN-10: 0080864333
- ISBN-13: 9780080864334
- Erscheinungsdatum: 31.07.1992
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