Advanced Transmission Electron Microscopy (PDF)
Imaging and Diffraction in Nanoscience
(Sprache: Englisch)
This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron...
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This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns.
Autoren-Porträt von Jian Min Zuo, John C. H. Spence
Jian-Min Zuo received his Ph.D. in Physics from Arizona State University in 1989. He is Racheff Professor of Materials Science and Engineering at University of Illinois, Urbana-Champaign. Prior to joining the faculty at the University of Illinois, he was a research scientist in Physics at Arizona State University and a visiting scientist to a number of universities and institutes in Germany, Japan and Norway. His current research topics include nanostructured materials and their structure determination, ferroelectric crystals, diffraction tomography, in-situ and fast electron microscopy. He is the recipient of the 2001 Burton Award of the Microscopy Society of America, Ruska prize of 2015 from German Microscopy Society and fellow of American Physical Society.John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).
Bibliographische Angaben
- Autoren: Jian Min Zuo , John C. H. Spence
- 1st ed. 2017, 729 Seiten, Englisch
- Verlag: Springer-Verlag GmbH
- ISBN-10: 1493966073
- ISBN-13: 9781493966073
- Erscheinungsdatum: 26.10.2016
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- Grösse: 26 MB
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Pressezitat
“This book is more about imaging and diffraction; although the knowledge covered makes it easier to understand energy-dispersive spectroscopy and electron energy-loss spectroscopy … . This book would be a good choice for students or researchers who have some knowledge and experience and are seeking a better understanding of TEM or are planning in-depth microstructural analysis work.” (Wanfeng Li, MRS Bulletin, Vol. 43, April, 2018)
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