Scanning Probe Microscopy in Nanoscience and Nanotechnology
(Sprache: Englisch)
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy...
Leider schon ausverkauft
versandkostenfrei
Buch
Fr. 401.90
inkl. MwSt.
- Kreditkarte, Paypal, Rechnungskauf
- 30 Tage Widerrufsrecht
Produktdetails
Produktinformationen zu „Scanning Probe Microscopy in Nanoscience and Nanotechnology “
Klappentext zu „Scanning Probe Microscopy in Nanoscience and Nanotechnology “
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Autoren-Porträt
Dr. Bharat Bhushan is an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Professor in the College of Engineering, and the Director of the Nanoprobe Laboratory for Bio- & Nanotechnology and Biomimetics (NLB2) at the Ohio State University, Columbus, Ohio. He holds two M.S., a Ph.D. in mechanical engineering/mechanics, an MBA, and three semi-honorary and honorary doctorates. His research interests include fundamental studies with a focus on scanning probe techniques in the interdisciplinary areas of bio/nanotribology, bio/nanomechanics and bio/nanomaterials characterization, and applications to bio/nanotechnology and biomimetics. He has authored 6 scientific books, more than 90 handbook chapters, more than 700 scientific papers (h factor - 42+), and more than 60 scientific reports, edited more than 45 books, and holds 17 U.S. and foreign patents. He is co-editor of Springer NanoScience and Technology Series and Microsystem Technologies. He has organized variousinternational conferences and workshops. He is the recipient of numerous prestigious awards and international fellowships including the Alexander von Humboldt Research Prize for Senior Scientists, Max Planck Foundation Research Award for Outstanding Foreign Scientists, and the Fulbright Senior Scholar Award. He is a member of various professional societies, including the International Academy of Engineering (Russia). He has previously worked for various research labs including IBM Almaden Research Center, San Jose, CA. He has held visiting professor appointments at University of California at Berkeley, University of Cambridge, UK, Technical University Vienna, Austria, University of Paris, Orsay, ETH Zurich and EPFL Lausanne.
Bibliographische Angaben
- 2011, 816 Seiten, Masse: 16,3 x 24,5 cm, Gebunden, Englisch
- Herausgegeben:Bhushan, Bharat
- Herausgegeben: Bharat Bhushan
- Verlag: Springer
- ISBN-10: 3642104967
- ISBN-13: 9783642104961
- Erscheinungsdatum: 10.01.2011
Sprache:
Englisch
Kommentar zu "Scanning Probe Microscopy in Nanoscience and Nanotechnology"
0 Gebrauchte Artikel zu „Scanning Probe Microscopy in Nanoscience and Nanotechnology“
Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
---|
Schreiben Sie einen Kommentar zu "Scanning Probe Microscopy in Nanoscience and Nanotechnology".
Kommentar verfassen