New Horizons of Applied Scanning Electron Microscopy

Application Example 1: Lateral Resolution of in-Lens SE and High-Angle BSE Imaging at Low Accelerating Voltages, Below 2.0 kV.- Application Example 2: Z-Contrast Sensitivity in Low-Voltage, High-Angle BSE Imaging.- Application Example 3: Information Depth in Low-Voltage, High-Angle BSE Imaging.- Application Example 4: Nano Inclusions in Co-Hardened Gold Plating for Electronic Applications #x2013; Further Evidence for High Lateral Resolution in Low-Voltage, High-Angle BSE Imaging.- Application Example 5: A Thin Layer of Organic Contaminant on the Surface of Mirror-Polished Al-Based Hard Disks.- Application Example 6: A Further Potential of Ultralow-Voltage In-lens SE Imaging.- Application Example 7: Sample Surface Preparation by Ultramicrotomy Using a Diamond Knife for Cross-Sectional Examination of Various Coatings on Metals.- Application Example 8: Cross-Sectional Examination of a Galvanized Steel.- Application Example 9: Cross-Sectional Examination of a Painted Steel.- Application Example 10: Cross-Sectional Examination of Solder Joint of the Printed Circuit Board.- Application Example 11: Cross-Sectional Examination of a Tin-Plated Copper Sheet for Electronic Application.- Application Example 12: Cross-Sectional Examination of an Anodized Aluminum Alloy for Aerospace Application.- Application Example 13: Cross-Sectional Examination of a Porous Anodic Oxide Film Grown on a Heterogeneous Al-Fe Alloy.- Application Example 14: Corrosion of an Al 2024-T3 Alloy for Aerospace Application.- Application Example 15: Cross-Sectional Examination of an Etched Al Foil for Capacitor Application.- Application Example 16: On the Nature of rf-GD Sputtering.- Application Example 17: On the Surface Damages Associated with rf-GD Sputtering.- Application Example 18: Precipitates in a Stainless Steel.- Application Example 19: Ferrite Precipitates in a Low-Carbon Stainless Steel.- Application Example 20: A Novel Use of rf-GD Sputtered Surfaces for Oxidation Study of Iron, Nickel, and

From the reviews:"The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. ... In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed." (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)